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																@@ -496,7 +496,7 @@ namespace MECF.Framework.Common.SubstrateTrackings 
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																             string waferOrigin = _locationWafers[source][sourceSlot].WaferOrigin; 
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																             string waferOrigin = _locationWafers[source][sourceSlot].WaferOrigin; 
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																             _locationWafers[source][sourceSlot].IsDuplicated = true; 
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																             _locationWafers[source][sourceSlot].IsDuplicated = true; 
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																-            WaferInfo wafer = CopyWaferInfo(source, sourceSlot, _locationWafers[destination][destSlot]); 
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																+            WaferInfo wafer = CopyWaferInfo(destination, destSlot, _locationWafers[source][sourceSlot]); 
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																             _duplicatedWafers.Add(new DulicatedWaferInfo(wafer.InnerId, source, sourceSlot, destination, destSlot)); 
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																             _duplicatedWafers.Add(new DulicatedWaferInfo(wafer.InnerId, source, sourceSlot, destination, destSlot)); 
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																             LOG.Write(eEvent.EV_WAFER_DUPLICATED, ModuleName.System, waferOrigin, source.ToString(), (source + 1).ToString(), destination.ToString(), (destSlot + 1).ToString()); 
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																             LOG.Write(eEvent.EV_WAFER_DUPLICATED, ModuleName.System, waferOrigin, source.ToString(), (source + 1).ToString(), destination.ToString(), (destSlot + 1).ToString()); 
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